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Sayahbadkhor, M., Naddaf Oskouei, A., nasiri lakeh, M. (2020). Detecting a defective pin through the image processing in the production line. Electronic and Cyber Defense, 16(2), 87-96.
Mostafa Sayahbadkhor; Alireza Naddaf Oskouei; Masood nasiri lakeh. "Detecting a defective pin through the image processing in the production line". Electronic and Cyber Defense, 16, 2, 2020, 87-96.
Sayahbadkhor, M., Naddaf Oskouei, A., nasiri lakeh, M. (2020). 'Detecting a defective pin through the image processing in the production line', Electronic and Cyber Defense, 16(2), pp. 87-96.
Sayahbadkhor, M., Naddaf Oskouei, A., nasiri lakeh, M. Detecting a defective pin through the image processing in the production line. Electronic and Cyber Defense, 2020; 16(2): 87-96.